AFM Accessories » Calibration Gratings

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Lateral-(xy)-Calibration Standard (2D200)

Lateral-(xy)-Calibration Standard (2D200)
Standard for precise lateral calibration with 200 nm pitch
price: €863.00
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H8

H8
Standard for precise height calibration
price: €1 380.00
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TGXYZ02

TGXYZ02
XYZ Calibration Grating, 100nm Step Height, 5µm and 10µm Pitch
Various purchasing options »
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TGX

TGX
Grating with Undercut Edge Structures for Lateral Calibration and Tip Aspect Ratio Determination
Various purchasing options »
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CS-20NG

CS-20NG
XYZ Calibration Nanogrid; Arrays with Down to 500nm Pitch; 20nm Height
Various purchasing options »
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Tipcheck AFM Tip Characterizer

Tipcheck AFM Tip Characterizer
Sample for Analyzing AFM Tip Geometry
Various purchasing options »
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HS-100MG

HS-100MG
Height Calibration Standard, 100 nm
Various purchasing options »
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Lateral-(xy)-Calibration Standard (2D300)

Lateral-(xy)-Calibration Standard (2D300)
Standard for precise lateral calibration with 300 nm pitch
price: €863.00
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Flatness Standard (FLAT)

Flatness Standard (FLAT)
Standard for accurate flatness calibration
Various purchasing options »
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TGXYZ01

TGXYZ01
XYZ Calibration Grating, 20nm Step Height, 5µm and 10µm Pitch
Various purchasing options »
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IVPS100

IVPS100
AFM Probe Tip characterizer: Improved Vertical Parallel Structure
price: €2 748.00
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TGXYZ03

TGXYZ03
XYZ Calibration Grating, 500nm Step Height, 5µm and 10µm Pitch
Various purchasing options »
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TGF11

TGF11
Grating with Trapezoid Structures for Lateral Force Calibration and Scanner Nonlinearity Assessment
Various purchasing options »
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HS-20MG

HS-20MG
Height Calibration Standard, 20 nm
Various purchasing options »
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HS-500MG

HS-500MG
Height Calibration Standard, 500 nm
Various purchasing options »
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IFSR

IFSR
AFM Probe Tip Characterizer: Line with sharp, overhanging edges.
price: €1 667.00
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ISNE

ISNE
AFM Probe Tip characterizer: Sharp silicon "nanoedge", with steep slope
price: €2 748.00