AR5-NCLR datasheet
AFM Probe Type: AR5-NCLR
Product Description:
For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 5:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.
The probe offers unique features:
- length of the high aspect ratio portion of the tip > 2 µm
- typical aspect ratio at 2 µm in the order of 7:1 (when viewed from side as well as along
cantilever axis)
- excellent tip radius of curvature
- highly doped to dissipate static charge
- high mechanical Q-factor for high sensitivity
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
of the alignment chip
- compatible with PointProbe® Plus XY-Alignment Series
This product features alignment grooves on the backside of the holder chip.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| 1 | 225 µm(215 - 235 µm)* | 38 µm(30 - 45 µm)* | 7 µm(6 - 8 µm)* | 48 N/m(21 - 98 N/m)* | 190 kHz(146 - 236 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Radius | Half Cone Angles |
|---|---|---|---|
| 1 | High-Aspect-Ratio | <15 nm guaranteed | typically < 5° at 2 µm of the high aspect ratio portion |
* guaranteed range
Coating:
Aluminium reflex coating on detector side of the cantilever
Sensors Datasheets:
Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
Terms and Conditions for NANOSENSORS