ARROW-CONTPt datasheet
AFM Probe Type: ARROW-CONTPt
Product Description:
NanoWorld Arrow™ CONTPt AFM probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.
All AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The SPM probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.
Additionally this probe offers an excellent tip radius of curvature.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 450 µm(445 - 455 µm)* | 45 µm(40 - 50 µm)* | 2 µm(1.5 - 2.5 µm)* | 0.2 N/m(0.06 - 0.38 N/m)* | 14 kHz(10 - 19 kHz)* |
AFM Tips:
| Shape | Tip Height | Tip Radius |
|---|---|---|
| Arrow | 10 - 15 µm* | <10 nm |
* typical range
Coating:
Sensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
Manufactured on demand, please contact us for availabilty. |
Price Description: |
Does not include VAT or customs duties. |
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