NANOSENSORS™ AdvancedTEC™ Cont AFM probes are designed for contact mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM scanning probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).
Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.
The probe offers unique features:
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 450 µm (440 - 460 µm)* | 50 µm (45 - 55 µm)* | 2 µm (1 - 3 µm)* | 0.2 N/m (0.02 - 0.75 N/m)* | 15 kHz (7 - 25 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Visible | 0 µm (15 - 20 µm)* | 15 - 20 µm* | 0 µm (0 - 0 µm)* | < 10 nm |
< 12° along the cantilever axis < 8° seen from the side |
* guaranteed range
On stock
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank charges
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| ATEC-CONT-10 | 10 pcs | 384.00 |
|
| ATEC-CONT-20 | 20 pcs | 686.00 |
|
| ATEC-CONT-50 | 50 pcs | 1513.00 |
|
One tiny amount of static electricity while you are handling these probes will destroy the tip!
We highly recommend that you utilize an ESD station and if you do not already have one, we have a mobile ESD station for only 70 EUR.
Considering the costs of these probes, this is a very wise investment.