- Home
- » Products
- » AFM Probes
- » ATEC-FMAu
ATEC-FMAu Specification Sheet
AFM Probe Type: ATEC-FMAu
-
Call us: + 49 (0) 6441 870 6272 Wetzlar, Germany
- + 49 (0) 6 441 870 6 272
- + 49 (0) 6 441 870 6 274
- info@nanoandmore.com
- close
Order this product
Print spec sheet
Get a free sample
Product Description:
NANOSENSORS AdvancedTEC™ FMAu AFM tips are designed for force modulation mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever.
This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM scanning probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).
Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.
The probe offers unique features:- REAL TIP VISIBILITY FROM TOP
- metallic conductivity of the tip
- high mechanical Q-factor for high sensitivity
- Tip height 15-20 µm
- Aspect Ratio of the last 1.5 µm of the tip > 4:1 (from front and side)
- Tip shape is defined by real crystal planes resulting in highly reproducible geometries and extremely smooth surfaces
- Highly doped single crystal silicon (0.01-0.025 Ohm*cm)
- Rectangular cantilever with trapezoidal cross section
- Holder dimensions are 1.6 mm x 3.4 mm
Please note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode or where it is necessary to conduct high currents.
AFM Probe Series:
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 240 µm (230 - 250 µm)* | 35 µm (30 - 40 µm)* | 3 µm (2 - 4 µm)* | 2.8 N/m (0.7 - 9 N/m)* | 85 kHz (50 - 130 kHz)* | ||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Visible | 0 µm (15 - 20 µm)* | 15 - 20 µm* | 0 µm (0 - 0 µm)* |
* guaranteed range
Coating:
The metallic coating is an approximately 70 nm thick double layer of chromium and gold on both sides of the cantilever.The tip side coating enhances the conductivity of the tip and allows electrical contacts.
The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the cantilever. The coating process is optimized for stress compensation and wear resistance.
The bending of the cantilever due to stress is less than 3.5% of the cantilever length.
Purchasing Information
Product Availability:
On stock
Price Description:
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank chargesTerms & Conditions:
Order:
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| ATEC-FMAu-10 | 10 pcs | 768.00 |
|
DANGER!
One tiny amount of static electricity while you are handling these probes will destroy the tip!
We highly recommend that you utilize an ESD station and if you do not already have one, we have a mobile ESD station for only 70 EUR.
Considering the costs of these probes, this is a very wise investment.