AFM Tip CDT-CONTR

CDT-CONTR datasheet

manufacturer:

www.nanosensors.com

View this AFM Tip
on manufacturer's website

AFM Probe Type: CDT-CONTR

Product Description:

NANOSENSORS^™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging.

For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is slightly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

    The probe offers unique features:
        - real diamond coating, slightly doped
        - high mechanical Q-factor for high sensitivity

Application Modes:

AFM Probe Specifications:

AFM Cantilevers:

Shape	Length	Width	Thickness	Force Const.	Res. Freq.
beam	450 µm(440 - 460 µm)*	50 µm(42.5 - 57.5 µm)*	2 µm(1 - 3 µm)*	0.2 N/m(0.02 - 0.77 N/m)*	13 kHz(6 - 21 kHz)*

AFM Tips:

Shape	Tip Radius
Standard	<200 nm guaranteed

* guaranteed range

Coating:

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.

Sensors Datasheets:

Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.

Purchasing Info:

Product Availability:	From stock
Price Description:	Does not include VAT or customs duties.

Order:

Order Code	Sensors per Set	price, EUR
CDT-CONTR-10	10 pcs	1277.00
CDT-CONTR-20	20 pcs	2285.00
CDT-CONTR-50	50 pcs	5040.00

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