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CNT-NCH Specification Sheet
AFM Probe Type: CNT-NCH
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Print spec sheetProduct Description:
NANOSENSORS™ CNT-NCH AFM probes are designed for maximum-resolution, high-speed and low-force imaging in non-contact mode or tapping mode AFM in air.
The probe offers unique features:
- sole Single (SWNT) OR Double Wall Carbon (DWNT) Nanotube at the silicon tip apex
- The Carbon Nanotubes are grown by Chemical Vapor Deposition and are ready to use,
no shortening or post processing is necessary. The production process will either result in
SWNT (0.6 nm radius) or in DWNTs (1.2 nm radius)
- Carbon Nanotube length shorter than 750nm
- Carbon Nanotube aligned better than ±20° to the center axis of the silicon tip
- real Carbon Nanotube - no amorphous or "Diamond like" Carbon spike (no parasitic spikes
close to the CNT apex)
- hydrophobic tip material (CNT)
- chemically inert
- self-limiting probe-sample force due to the CNTs lateral flexibility
- highly doped to dissipate static charge
- high mechanical Q-factor for high sensitivity
Please note:
NANOSENSORS™ Carbon Nanotube Probes are designed for high resolution imaging.
NANOSENSORS™ CNT Probes are not suitable for surfaces with high aspect ration structures like very narrow deep trenches or contact holes. They are expert probes that require special care to enable the user to profit from their unique properties and achieve good results. For further information please have a look at our brochure "How to use a Single / Double Wall CNT Probe".
The production process results in probes with Single or Double Wall CNTs in the same production run. Unfortunately it is not possible to select them.
Tip data regarding the Carbon Nanotube:
Carbon Nanotube length < 750 nm
Carbon Nanotube radius < 2.1 nm
Carbon Nanotube tilt angle < ±20°
This product features alignment grooves on the backside of the holder chip.
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 125 µm (115 - 135 µm)* | 30 µm (30 - 45 µm)* | 4 µm (3 - 5 µm)* | 42 N/m (10 - 130 N/m)* | 330 kHz (204 - 497 kHz)* | ||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| CNT, Supersharp |
0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* | < 1.2 nm |
* guaranteed range
Coating:
NoneProbes Datasheets:
Individual SEM picture for each delivered probe in sets of 2 or 5 probes.Purchasing Information
Product Availability:
Please contact us for further information!
Price Description:
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank chargesTerms & Conditions:
Order:
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| CNT-NCH-2 | 2 pcs | 775.00 |
|
| CNT-NCH-5 | 5 pcs | 1800.00 |
|
IMPORTANT NOTICE!
NANOSENSORS?„? Carbon Nanotube Probes are designed for high resolution imaging.
They are not suitable for surfaces with high aspect ration structures like very narrow deep trenches or contact holes.
They are expert probes that require special care to enable the user to profit from their unique properties and achieve good results. For further information please have a look at our brochure "How to use a Single / Double Wall CNT Probe".
The production process results in probes with Single or Double Wall CNTs in the same production run. Unfortunately it is not possible to select them.