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CONTSCR Specification Sheet
AFM Probe Type: CONTSCR
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Product Description:
NanoWorld Pointprobe® CONTSCR AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
All SPM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
Additionally this probe offers excellent tip radius of curvature.
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 µm (220 - 230 µm)* | 48 µm (42.5 - 52.5 µm)* | 1 µm (0.5 - 1.5 µm)* | 0.2 N/m (0.02 - 0.7 N/m)* | 23 kHz (10 - 39 kHz)* | ||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 0 µm (10 - 15 µm)* | 10 - 15 µm* | 0 µm (0 - 0 µm)* | < 8 nm (< 12 nm guaranteed) |
* typical range
Coating:
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.Probes Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.Datasheet for up to 32 sensors with full wafer.
Purchasing Information
Product Availability:
On stock
Price Description:
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank chargesTerms & Conditions:
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Order:
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| CONTSCR-10 | 10 pcs | 285.00 |
|
| CONTSCR-20 | 20 pcs | 510.00 |
|
| CONTSCR-50 | 50 pcs | 1125.00 |
|
| CONTSCR-W | 385 pcs | 5777.00 |
|