- Home
- » Products
- » AFM Probes
- » CP-CONT-PS
CP-CONT-PS Specification Sheet
AFM Probe Type: CP-CONT-PS
-
Call us: + 49 (0) 6441 870 6272 Wetzlar, Germany
- + 49 (0) 6 441 870 6 272
- + 49 (0) 6 441 870 6 274
- info@nanoandmore.com
- close
on manufacturer's website
Order this product
Print spec sheetProduct Description:
The new sQube® colloidal probe combines the well-known features of the proven NANOSENSORS™ Cont series such as high application versatility and compatibility with most commercial SPMs with a reproducible sphere radius instead of a sharp tip. The excellent radius and the minimized variation of diameter provide reproducible signals.
CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant..
The so called "Colloidal Probe Technique", where single colloids are attached to AFM cantilevers for force measurements, opens the chance for a better understanding of fundamental interactions in a variety of fields.
Examples are adhesion phenomena, particle-surface-interactions, mechanical
properties, suspensions, hydrodynamics and boundary slip - to name just some out of an
increasing number of applications.
The probe offers unique features:
- sphere material:polystyrol (PS)
- excellent sphere diameter A = 1,98 µm, B = 3,6 µm, or C = 6,1 µm (all +/- 5%)
(Due to different masses the resonance frequency can differ.)
Please choose A, B, or C by ordering!
- highly doped cantilever to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
of the alignment chip
- compatible with PointProbe® Plus XY-Alignment Series
This product features alignment grooves on the backside of the holder chip.
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 450 µm (440 - 460 µm)* | 50 µm (42.5 - 57.5 µm)* | 2 µm (1 - 3 µm)* | 0.2 N/m (0.02 - 0.77 N/m)* | 13 kHz | ||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Sphere | 3.6 µm (1.88 - 6.405 µm)* | 1.88 - 6.405 µm* | 0 (0 - 0 )* | < 1800 nm (< 3200 nm guaranteed) |
* typical range
Coating:
NonePurchasing Information
Product Availability:
On stock
Price Description:
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank chargesTerms & Conditions:
Order:
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| CP-CONT-PS-A-5 | 5 pcs | 396.00 |
|
| CP-CONT-PS-C-5 | 5 pcs | 396.00 |
|
| CP-CONT-PS-B-5 | 5 pcs | 396.00 |
|