AFM Probe Type: CP-CONT-SiO

Call us: + 49 (0) 6441 870 6272 Wetzlar, Germany
- + 49 (0) 6 441 870 6 272
- + 49 (0) 6 441 870 6 274
- info@nanoandmore.com
close

manufacturer:

www.sqube.com

View this AFM Tip
on manufacturer's website

Learn more about this and other AFM Tips

Learn more about this and other AFM Cantilevers

Product Description:

The new sQube® colloidal probe combines the well-known features of the proven NANOSENSORS™ Cont series such as high application versatility and compatibility with most commercial SPMs with a reproducible sphere radius instead of a sharp tip. The excellent radius and the minimized variation of diameter provide reproducible signals.

CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant..

The so called "Colloidal Probe Technique", where single colloids are attached to AFM cantilevers for force measurements, opens the chance for a better understanding of fundamental interactions in a variety of fields.

Examples are adhesion phenomena, particle-surface-interactions, mechanical properties, suspensions, hydrodynamics and boundary slip - to name just some out of an increasing number of applications.

The probe offers unique features:

        - sphere material: silicon dioxide (SiO₂)
        - excellent sphere, diameter A = 2 µm, B = 3,5µm, or C = 6,62 µm (all +/- 5%)
          (Due to different masses the resonance frequency can differ.)
          Please choose A, B, or C by ordering!
        - highly doped cantilever to dissipate static charge
        - chemically inert
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
        of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the backside of the holder chip.

Application Modes:

AFM Probe Specifications:

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	450 µm (440 - 460 µm)*	50 µm (42.5 - 57.5 µm)*	2 µm (1 - 3 µm)*	0.2 N/m (0.02 - 0.77 N/m)*	13 kHz (6 - 21 kHz)*

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Sphere	3.5 µm (1.87 - 7 µm)*	1.87 - 7 µm*	0 (0 - 0 )*	< 1750 nm (< 3500 nm guaranteed)

* typical range

Coating:

None

Purchasing Information

Product Availability:
On stock
Price Description:
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank charges
Terms & Conditions:
NanoAndMore GmbH Terms and Conditions for Shipment of Goods

your basket is EMPTY

Order:

Order Code	Probes per Set	price, EUR
CP-CONT-SiO-A-5	5 pcs	396.00
CP-CONT-SiO-B-5	5 pcs	396.00
CP-CONT-SiO-C-5	5 pcs	396.00

CP-CONT-SiO Specification Sheet