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ContAl Specification Sheet
AFM Probe Type: ContAl
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- + 49 (0) 6 441 870 6 274
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Product Description:
Rotated, monolithic silicon AFM probe for contact mode applications;
Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).
Consistent high quality at a lower price!
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 450 µm (440 - 460 µm)* | 50 µm (45 - 55 µm)* | 2 µm (1 - 3 µm)* | 0.2 N/m (0.07 - 0.4 N/m)* | 13 kHz (9 - 17 kHz)* | ||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Rotated | 17 µm (15 - 19 µm)* | 15 - 19 µm* | 15 µm (10 - 20 µm)* | < 10 nm |
20°-25° along cantilever axis |
* typical range
Coating:
Aluminium reflex coating on detector side of the cantilever, 30 nm thickPurchasing Information
Product Availability:
On stock
Price Description:
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank chargesTerms & Conditions:
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Order:
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| ContAl-10 | 10 pcs | 191.00 |
|
| ContAl-50 | 50 pcs | 809.00 |
|
| ContAl-W | 380 pcs | 3900.00 |
|