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DDESP Specification Sheet
AFM Probe Type: DDESPOriginal manufacturer type: NW-CDT-NCHR
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Learn more about this and other AFM Tips
Learn more about this and other AFM Cantilevers
- Similar AFM Tips:
- Conductive Diamond Coated AFM Tips
- Uncoated AFM Tips
- Silicon AFM Tips
- 3-sided Sharpened Pyramidal AFM Tips
- Standard Non-Rotated AFM Tips
- Similar AFM Cantilevers:
- Aluminum Coated AFM Cantilevers
- Silicon AFM Cantilevers
- Trapezoidal Cross Section AFM Cantilevers (tip on narrow flank)
- Rectangular / Diving Board AFM Cantilevers
- Conductive Diamond Coated AFM Cantilevers
- Tapping Mode AFM Cantilevers
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Product Description:
NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
For applications that require hard contact between tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.
The CDT features a conductive diamond coating. Some typical applications for this tip are Scanning Spreading Resistance Microscopy (SSRM), Tunneling AFM (Conducting AFM) and Scanning Capacitance Microscopy (SCM).
This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Veeco Instruments Inc. is no longer selling this probe which has always been manufactured by NanoWorld®.
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 125 µm (120 - 130 µm)* | 30 µm (25 - 35 µm)* | 4 µm (3.5 - 4.5 µm)* | 42 N/m (21 - 78 N/m)* | 320 kHz (250 - 390 kHz)* | ||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 0 µm (10 - 15 µm)* | 10 - 15 µm* | 0 µm (0 - 0 µm)* | < 200 nm guaranteed |
* typical range
Coating:
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.Probes Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.Datasheet for up to 32 sensors with full wafer.
Purchasing Information
Product Availability:
On stock
Price Description:
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank chargesTerms & Conditions:
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Order:
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| DDESP-10 | 10 pcs | 1296.00 |
|
| DDESP-20 | 20 pcs | 2319.00 |
|
| DDESP-50 | 50 pcs | 5115.00 |
|
| Request a free sample | |||