ElectriMulti75-G datasheet

manufacturer:
www.budgetsensors.com
View this AFM Tip
on manufacturer's website

AFM Probe Type: ElectriMulti75-G

Product Description:

Rotated, monolithic silicon AFM probe with symmetric tip shape, designed for force modulation, pulsed force mode (PFM) and electric modes like:
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;

The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). Chipsize: 3.4 x 1.6 x 0.3 mm

Consistent high quality at a lower price!

This product features alignment grooves on the backside of the holder chip.

AFM Probe Specifications:
  AFM Cantilevers:
Cant. LengthWidthThicknessForce Const.Res. Freq.
1 225 µm(215 - 235 µm)* 28 µm(23 - 33 µm)* 3 µm(2 - 4 µm)* 3 N/m(1 - 7 N/m)* 75 kHz(60 - 90 kHz)*
  AFM Tips:
on Cant. ShapeTip HeightTip Set BackTip RadiusHalf Cone Angles
1 Rotated 17 µm(15 - 19 µm)* 15 nm(10 - 20 nm)* <25 nm 20°-25° along cantilever axis
25°-30° from side
10° at the apex

* typical range

Coating:

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

Sensors Datasheets:

No datasheet

Purchasing Info:

Product Availability:
From stock
Price Description:

* FREE for orders valued more than 500 EUR.
* 10 EUR for orders valued less than 500 EUR.
VAT or customs duties not included.

Order:
Order Code Sensors per Set price, EUR Quantity
Multi75E-G-10
10 pcs 219.00 add to shopping cart
Multi75E-G-50
50 pcs 910.00 add to shopping cart
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