Product Description:

EBD HCD on single AFM cantilever. Each tip is SEM inspected.
The HDC Lithography tip L1 withstands very high forces when used as a lithographyc tool or micromechanical manipulator. Our patented tripod stabilization system produces an ultimate stability at the silicon - HDC interface such allowing to use the extreme hardness of the diamond like HDC material. The hardness of the High Density Carbon Tip allows to stamp some hundrets of holes in photoresit or harder materials like InAs without any lost of resolution.
Tip Height > 300 nm +/- 100 nm, Diameter < 60 nm, plasma sharpened tip: radius < 10 nm, tip half cone angle: < 4°. Tilt angle 0- 13°. 0 deg, perpendicular to surface for punching, -13 deg. to surface for scratching.The HDC material itself is hydrophobic - extremely useful for scanning in liquids and for applications in biology and medicine. No tip degradation while scanning and by the tip approach, even on hard samples like SiO2 and Ti.

Application Modes:

• Lithography AFM Probes

AFM Probe Specifications:

  AFM Cantilevers:

  AFM Tips:

Coating:

None

Sensors Datasheets:

On request we characterize every single, individual tip by high resolution SEM. Let us know, which datas you are intrested in: HDC-tip length, -diameter, -radius, half cone angle, -tilt angle, -aspect ratio. Price for a certificate, per tip: 80 EUR.