Product Description:

EBD HCD on single AFM cantilever. Each tip is SEM inspected.
The Metrology Tip M1 has an extreme small tip diameter and is tilted with respect to the cantilever to achieve an orientation precisely normal to the surface.
Tip Height > 700 nm +/- 100 nm, Diameter < 50 nm, plasma sharpened tip: radius < 5 nm, tip half cone angle: < 4°.The HDC material itself is hydrophobic - extremely useful for scanning in liquids and for applications in biology and medicine. No tip degradation while scanning and by the tip approach, even on hard samples like SiO2 and Ti.

Application Modes:

• Trench Measurement / High Aspect Ratio AFM Tips

AFM Probe Specifications:

  AFM Cantilevers:

  AFM Tips:

Coating:

None

Sensors Datasheets:

On request we characterize every single, individual tip by high resolution SEM. Let us know, which datas you are intrested in: HDC-tip length, -diameter, -radius, half cone angle, -tilt angle, -aspect ratio. Price for a certificate, per tip: 80 EUR.