NW-SSS-NCL datasheet
AFM Probe Type: NW-SSS-NCL
Product Description:
NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.
This probe offers unique features:
- excellent tip radius of curvature
- guaranteed tip radius of curvature 5 nm (yield >80%)
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| 1 | 225 µm(220 - 230 µm)* | 38 µm(33 - 43 µm)* | 7 µm(6.5 - 7.5 µm)* | 48 N/m(31 - 71 N/m)* | 190 kHz(160 - 210 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Height | Tip Radius | Half Cone Angles |
|---|---|---|---|---|
| 1 | Supersharp | 10 - 15 µm* | <2 nm( < 5 nm guaranteed ) | < 10° at the last 200 nm of the tip |
* typical range
Coating:
None
Sensors Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.
Datasheet for up to 32 sensors with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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