NW-SSS-SEIH datasheet
AFM Probe Type: NW-SSS-SEIH
Product Description:
NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode. All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip. Additionally this probe offers excellent tip radius of curvature.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 225 µm(220 - 230 µm)* | 33 µm(27.5 - 37.5 µm)* | 5 µm(4.5 - 5.5 µm)* | 15 N/m(9 - 25 N/m)* | 130 kHz(110 - 150 kHz)* |
AFM Tips:
| Shape | Tip Height | Tip Radius | Half Cone Angles |
|---|---|---|---|
| Supersharp | 10 - 15 µm* | <2 nm( < 5 nm guaranteed ) | < 10° at 200 nm from apex |
* typical range
Coating:
None
Sensors Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.
Datasheet for up to 32 sensors with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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