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PL2-CONT Specification Sheet
AFM Probe Type: PL2-CONT
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Product Description:
The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.
NANOSENSORS™ PL2-CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request
The probe offers unique features:
- plateau diameter of typically 1.8 µm
- single crystalline silicon
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 450 µm (440 - 460 µm)* | 50 µm (42 - 57 µm)* | 2 µm (1 - 3 µm)* | 0.2 N/m (0.02 - 0.77 N/m)* | 13 kHz (6 - 21 kHz)* | ||
AFM Tip:
| Shape | Plateau diameter (**) | Plateau rod height | Plateau edge radius | Tip height (overall) |
|---|---|---|---|---|
| plateau | 1.8 ± 0.5 µm | > 2.0 µm | 0.2 - 0.4 µm | 10 - 15 µm |
* guaranteed range
** measured at a distance of 100nm from the end-face
Coating:
NoneProbes Datasheets:
Datasheet for all AFM probes with sets of 10 probes.Purchasing Information
Product Availability:
On stock
Price Description:
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank chargesTerms & Conditions:
Order:
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| PL2-CONT-10 | 10 pcs | 767.00 |
|