The Pyrex-Nitride probes have silicon nitride cantilevers with very low force constants and integrated oxide sharpened, pyramidal tips. This probe series features a support chip that is made of Pyrex. Two chip versions are available: The DB series with rectangular / diving board cantilevers and the TR series having triangular cantilevers. Both sides of the chip have identical cantilevers. All cantilevers are stress compensated and have a 70 nm chromium / gold backside coating for high laser reflectivity.
All chips are pre-separated prior to shipment and come in Gel-Pak containers.
Additionally this probe offers an excellent tip radius of curvature. The cantilever bending is below 2°.
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| 1 | beam | 100 µm | 40 µm | 600 nm | 0.48 N/m | 67 kHz | |
| 2 | beam | 200 µm | 40 µm | 600 nm | 0.06 N/m | 17 kHz | |
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| 1 | Pyramid | 3.5 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* | < 10 nm | ||
| 2 | Pyramid | 3.5 µm | 0 - 0 µm* | 0 (0 - 0 )* | < 10 nm |
* typical range
On stock
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank charges