NanoWorld Pyrex-Nitride probes are designed for various imaging applications in contact or dynamic mode.
The Pyrex-Nitride probes have silicon nitride cantilevers with very low force constants and integrated oxide sharpened, pyramidal tips. The probe series features a support chip that is made of Pyrex. The TR series features two different triangular cantilevers. Both sides of the chip have identical cantilevers. All cantilevers are stress compensated and have a 65 nm chromium / gold backside coating for high laser reflectivity.
All chips are pre-separated prior to shipment and come in Gel-Pak containers. Additionally this probe offers an excellent tip radius of curvature. The cantilever bending is below 2°.
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| 1 | triangular | 100 µm | 13.5 µm | 600 µm | 0.32 N/m | 67 kHz | |
| 2 | triangular | 200 µm | 28 µm | 600 µm | 0.08 N/m | 17 kHz | |
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| 1 | Pyramid | 3.5 µm | 0 - 0 µm* | 0 (0 - 0 )* | < 10 nm | ||
| 2 | Pyramid | 3.5 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* | < 10 nm |
* typical range
On stock
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