AFM Probe Type: PPP-CONTSC

Product Description:

The new PointProbe^® Plus (PPP) combines the well-known features of the proven PointProbe^® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

The NANOSENSORS^™ PPP-CONTSC is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

  
    The probe offers unique features:
        - excellent tip radius of curvature
        - highly doped to dissipate static charge
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe^® Plus XY-Alignment Series

This product features alignment grooves on the backside of the holder chip.

Application Modes:

• Contact Mode AFM Probes
• Lateral Force Mode AFM Probes (LFM)