NANOSENSORS™ PPP-NCSTPt AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.
The probe offers unique features:
- metallic conductivity of the tip
- high mechanical Q-factor for high sensitivity
Please note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode.
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 150 µm (140 - 160 µm)* | 27 µm (19.5 - 34.5 µm)* | 2.8 µm (1.8 - 3.8 µm)* | 7.4 N/m (1.2 - 29 N/m)* | 160 kHz (75 - 265 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* |
* guaranteed range
On stock
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Payment within 30 days from date of invoice, no discount. Payment free of bank charges