AFM Tip PPP-QFMR

PPP-QFMR datasheet

manufacturer:

www.nanosensors.com

View this AFM Tip
on manufacturer's website

AFM Probe Type: PPP-QFMR

Product Description:

The new PointProbe® Plus Q30K-Plus combines the well-known features of the proven PointProbe® Plus series such as a further reduced and more reproducible tip radius as well as a more defined tip shape with a high mechanical quality factor (Q-factor) under ultra high vacuum (UHV) conditions. The typical Q-factor of over 35000 under UHV conditions and the aluminium coating on the detector side provide excellent resolution and an enhanced signal to noise ratio.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode under UHV conditions. Due to its high Q-factor and the typical features of the PPP series this AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

    The probe offers unique features:
        - excellent tip radius of curvature
        - highly doped to dissipate static charge
        - Al coating on detector side of cantilever
        - excellent mechanical Q-factor under UHV conditions for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the backside of the holder chip.

Application Modes:

AFM Probe Specifications:

AFM Cantilevers:

Cant.	Length	Width	Thickness	Force Const.	Res. Freq.
1	225 µm(215 - 235 µm)*	28 µm(20 - 35 µm)*	3 µm(2 - 4 µm)*	2.8 N/m(0.5 - 9.5 N/m)*	75 kHz(45 - 115 kHz)*

AFM Tips:

on Cant.	Shape	Tip Radius
1	Standard	<7 nm( < 10 nm guaranteed )

* guaranteed range

Coating:

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

Sensors Datasheets:

Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.

Purchasing Info:

Product Availability:	From stock
Price Description:	Does not include VAT or customs duties.

Order:

Order Code	Sensors per Set	price, EUR	Quantity
PPP-QFMR-10	10 pcs	552.00

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