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PPP-QFMR Specification Sheet
AFM Probe Type: PPP-QFMR
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Product Description:
The new Point Probe®Plus Q30K-Plus combines the well-known features of the proven PointProbe® Plus series such as a further reduced and more reproducible tip radius as well as a more defined tip shape with a high mechanical quality factor (Q-factor) under ultra high vacuum (UHV) conditions. The typical Q-factor of over 35000 under UHV conditions and the aluminium coating on the detector side provide excellent resolution and an enhanced signal to noise ratio.
The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode under UHV conditions. Due to its high Q-factor and the typical features of the PPP series this AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped to dissipate static charge
- Al coating on detector side of cantilever
- excellent mechanical Q-factor under UHV conditions for high sensitivity
- precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
of the alignment chip
- compatible with PointProbe® Plus XY-Alignment Series
This product features alignment grooves on the backside of the holder chip.
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 µm (215 - 235 µm)* | 28 µm (20 - 35 µm)* | 3 µm (2 - 4 µm)* | 2.8 N/m (0.5 - 9.5 N/m)* | 75 kHz (45 - 115 kHz)* | ||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* | < 7 nm (< 10 nm guaranteed) |
* guaranteed range
Coating:
The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.Probes Datasheets:
Datasheet for all AFM probes with sets of 10 probes.Purchasing Information
Product Availability:
On stock
Price Description:
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank chargesTerms & Conditions:
Order:
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| PPP-QFMR-10 | 10 pcs | 552.00 |
|