PPP-RT-CONTR datasheet
AFM Probe Type: PPP-RT-CONTR
Product Description:
NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONTR type is optimized for high sensitivity due to a low force constant.
For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.
The probe offers unique features:
- excellent tip radius of curvature
- highly doped to dissipate static charge
- high mechanical Q-factor for high sensitivity
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| 1 | 450 µm(440 - 460 µm)* | 50 µm(42.5 - 57.5 µm)* | 2 µm(1 - 3 µm)* | 0.2 N/m(0.02 - 0.77 N/m)* | 13 kHz(6 - 21 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Radius |
|---|---|---|
| 1 | Rotated | <7 nm( < 10 nm guaranteed ) |
* guaranteed range
Coating:
Sensors Datasheets:
Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |

