Product Description:

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORS™ PPP-SEIH AFM probes (Seiko Instruments / high force constant).


    The probe offers unique features:
        - excellent tip radius of curvature
        - highly doped to dissipate static charge
        - chemically inert
        - high mechanical Q-factor for high sensitivity

Application Modes:

• Non-Contact / Tapping Mode AFM Probes