Product Description:

The new XY-auto alignment probes for Non-Contact / Tapping mode application (High resonance frequency) extend the well-known plug-and-fit auto alignment concept of the Alignment Chip (ALIGN) to 125 µm short cantilevers optimized for high speed non-contact / Tapping mode applications. If the alignment chip is mounted to the AFM head probe exchange is possible with a tip repositioning accuracy of better than ± 8 µm.

As a matter of course, the features of the proven Point Probe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS^™ PPP-XYNCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.

 
    The probe offers unique features:
        - excellent tip radius of curvature
        - highly doped to dissipate static charge
        - Al coating on detector side of cantilever
        - chemically inert
        - high mechanical Q-factor for high sensitivity
        - tip repositioning accuracy of better than ± 8 µm (in combination with Alignment Chip)

Application Modes:

• Non-Contact / Tapping Mode AFM Probes

AFM Probe Specifications:

  AFM Cantilevers:

  AFM Tips:

* guaranteed range

Coating:

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 3.5% of the cantilever length.