Rotated, monolithic silicon AFM probe for contact mode applications;
Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).
Consistent high quality at a lower price!
Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ContAl AFM probe.
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 450 µm (440 - 460 µm)* | 50 µm (45 - 55 µm)* | 2 µm (1 - 3 µm)* | 0.2 N/m (0.07 - 0.4 N/m)* | 13 kHz (9 - 17 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Rotated | 17 µm (15 - 19 µm)* | 15 - 19 µm* | 15 µm (10 - 20 µm)* | < 10 nm |
20°-25° along cantilever axis 25°-30° from side 10° at the apex |
* typical range
Available on demand. Please contact us for availability!
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank charges