Rotated, monolithic silicon AFM probe with symmetric tip shape, for contact mode and electric modes like:
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;
Consistent high quality at a lower price!
Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ElectriCont AFM probe.
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 450 µm (440 - 460 µm)* | 50 µm (45 - 55 µm)* | 2 µm (1 - 3 µm)* | 0.2 N/m (0.07 - 0.4 N/m)* | 13 kHz (9 - 17 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Rotated | 17 µm (15 - 19 µm)* | 15 - 19 µm* | 15 µm (10 - 20 µm)* | < 25 nm |
20°-25° along cantilever axis 25°-30° from side 10° at the apex |
* typical range
Available on demand. Please contact us for availability!
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank charges
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| Q-Cond-E-10 | 10 pcs | 340.00 |
|
| Request a free sample | |||