Q-Cond-E datasheet
AFM Probe Type:
Q-Cond-E
Premounted on a T-Plate for Quesant AFM systems
Product Description:
Rotated, monolithic silicon AFM probe with symmetric tip shape, for contact mode and electric modes like:
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). Chipsize: 3.4 x 1.6 x 0.3 mm
Consistent high quality at a lower price!
Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ElectriCont AFM probe.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| 1 | 450 µm(440 - 460 µm)* | 50 µm(45 - 55 µm)* | 2 µm(1 - 3 µm)* | 0.2 N/m(0.07 - 0.4 N/m)* | 13 kHz(9 - 17 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Height | Tip Set Back | Tip Radius | Half Cone Angles |
|---|---|---|---|---|---|
| 1 | Rotated | 17 µm(15 - 19 µm)* | 15 nm(10 - 20 nm)* | <25 nm | 20°-25° along cantilever axis 25°-30° from side 10° at the apex |
* typical range
Coating:
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.
Sensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
From stock. |
Price Description: |
Does not include VAT or customs duties. |
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