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SC-20-LM Specification Sheet
AFM Probe Type: SC-20-LM
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Print spec sheetProduct Description:
The SC-20-LM is similar to the SC-35-LM, but to further increase the resolution and decrease the tip field, the coating thickness has been reduced. This is the ideal tip for very sensitive samples, where the magnetic state of the sample can be easily influenced by the tip strayfield.
Tip Radius < 40 nm
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 µm | 0 µm | 0 µm | 2.8 N/m | 75 kHz | ||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Pyramid | 0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* | < 40 nm |
* typical range
Coating:
NonePurchasing Information
Product Availability:
On stock
Price Description:
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank chargesTerms & Conditions:
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Order:
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| SC-20-LM-10 | 10 pcs | 780.00 |
|
| SC-20-LM-20 | 20 pcs | 1405.00 |
|
| SC-20-LM-40 | 40 pcs | 2590.00 |
|
| SC-20-LM-80 | 80 pcs | 4685.00 |
|
| SC-20-LM-200 | 200 pcs | 9370.00 |
|