The SC-20-M is SmartTips® improved resolution side coated MFM probe. Compared to the standard SC-35-M probe it trades signal strength for improved resolution. It is therefore most suitable for high resolution measurements on hard magnetic samples. By the use of Side Coating technology the sharpness of the probe is maintained to combine good topographic resolution with high magnetic resolution and stability.
Tip Radius < 35 nm
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 µm | 0 µm | 0 µm | 2.8 N/m | 75 kHz | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Pyramid | 0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* | < 35 nm |
* typical range
On stock
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Payment within 30 days from date of invoice, no discount. Payment free of bank charges