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SC-35-LM Specification Sheet
AFM Probe Type: SC-35-LM
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Print spec sheetProduct Description:
The SC-35-LM is a low moment probe designed for the imaging of soft magnetic samples and other applications that required a reduced tip field. By the use of Side Coating in combination with a low magnetization coating, the tip field is low and confined to the tip apex. The SC-35-LM is the ideal probe to study domain patterns in soft magnetic media while maintaining good topographic resolution.
Tip radius < 40 nm
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 µm | 0 µm | 0 µm | 2.8 N/m | 75 kHz | ||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Pyramid | 0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* | < 40 nm |
* typical range
Coating:
NonePurchasing Information
Product Availability:
On stock
Price Description:
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank chargesTerms & Conditions:
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Order:
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| SC-35-LM-10 | 10 pcs | 655.00 |
|
| SC-35-LM-20 | 20 pcs | 1180.00 |
|
| SC-35-LM-40 | 40 pcs | 2185.00 |
|
| SC-35-LM-80 | 80 pcs | 3945.00 |
|
| SC-35-LM-200 | 200 pcs | 7890.00 |
|