Product Description:

The SC-35-LM is a low moment probe designed for the imaging of soft magnetic samples and other applications that required a reduced tip field. By the use of Side Coating in combination with a low magnetization coating, the tip field is low and confined to the tip apex. The SC-35-LM is the ideal probe to study domain patterns in soft magnetic media while maintaining good topographic resolution.

Tip radius < 40 nm 

Application Modes:

• Magnetic Force AFM Probes (MFM)

AFM Probe Specifications:

  AFM Cantilevers:

  AFM Tips:

Coating:

"Hard magnetic, low momentum coating on tip side of the cantilever: CoNi; 35 nm thick; Oe> 400; Magnetizatio < 50 kA/m; Typical magn. Resolution < 30 nm; Backside Al reflex coating"

Sensors Datasheets:

Not available