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SC-35-M Specification Sheet
AFM Probe Type: SC-35-M
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Print spec sheetProduct Description:
Suitable for most MFM applications. Due to the use of Side Coating technology it outperforms other (standard) MFM probes in both resolution and magnetic stability. Magnetic coating and layer thickness are balanced to obtain a versatile probe with good signal strength on most surface topographies, while maintaining good magnetic resolution.
Tip Radius < 40 nm
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 µm | 0 µm | 0 µm | 2.8 N/m | 75 kHz | ||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Pyramid | 0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* | < 40 nm |
* typical range
Coating:
NonePurchasing Information
Product Availability:
On stock
Price Description:
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank chargesTerms & Conditions:
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Order:
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| SC-35-M-10 | 10 pcs | 575.00 |
|
| SC-35-M-20 | 20 pcs | 1035.00 |
|
| SC-35-M-40 | 40 pcs | 1910.00 |
|
| SC-35-M-80 | 80 pcs | 3450.00 |
|
| SC-35-M-200 | 200 pcs | 6905.00 |
|