SC-35-M datasheet
manufacturer:

AFM Probe Type: SC-35-M
Product Description:
Suitable for most MFM applications. Due to the use of Side Coating technology it outperforms other (standard) MFM probes in both resolution and magnetic stability. Magnetic coating and layer thickness are balanced to obtain a versatile probe with good signal strength on most surface topographies, while maintaining good magnetic resolution.
Tip Radius < 40 nm
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Length | Force Const. | Res. Freq. |
|---|---|---|
| 225 µm | 2.8 N/m | 75 kHz |
AFM Tips:
| Shape | Tip Radius |
|---|---|
| Pyramid | <40 nm |
* typical range
Coating:
"Hard magnetic, high momentum coating on tip side of the cantilever: CoNi; 35 nm thick; Oe> 1000; Magnetizatio ~ 1100 kA/m; Typical magn. Resolution < 30 nm; "
Sensors Datasheets:
Not available
Purchasing Info:
Product Availability: |
5 working days ARO EXW Wetzlar |
Price Description: |
Does not include VAT or customs duties. |