SCM-PIT datasheet
AFM Probe Type:
SCM-PIT
Original Manufacturer Type: EFM
Product Description:
NanoWorld Pointprobe® EFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of probe yields a very high force sensitivity, while simultaneously enabling tapping™ and lift mode operation. All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| 1 | 225 µm(220 - 230 µm)* | 28 µm(22.5 - 32.5 µm)* | 3 µm(2.5 - 3.5 µm)* | 2.8 N/m(1.2 - 5.5 N/m)* | 75 kHz(60 - 90 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Height |
|---|---|---|
| 1 | Standard | 10 - 15 µm* |
* typical range
Coating:
Sensors Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.
Datasheet for up to 32 sensors with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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