NanoAndMore GmBH does not ship to your country. Please consider switching to NanoAndMore USA.
Regionalwebsite:
- NanoAndMore Europe
Follow us on:
- Home
- » Products
- » AFM Probes
- » SEIHR
You have a pending free samples request »
SEIHR Specification Sheet
AFM Probe Type: SEIHR
-
Call us: + 49 (0) 6441 870 6272 Wetzlar, Germany
- + 49 (0) 6 441 870 6 272
- + 49 (0) 6 441 870 6 274
- info@nanoandmore.com
- close
View this product on
manufacturer's website
manufacturer's website
Learn more about this and other AFM Tips
Learn more about this and other AFM Cantilevers
- Similar AFM Tips:
- Uncoated AFM Tips
- Silicon AFM Tips
- 3-sided Sharpened Pyramidal AFM Tips
- Standard Non-Rotated AFM Tips
- Similar AFM Cantilevers:
- Aluminum Coated AFM Cantilevers
- Silicon AFM Cantilevers
- Trapezoidal Cross Section AFM Cantilevers (tip on narrow flank)
- Rectangular / Diving Board AFM Cantilevers
Order this product
Print spec sheet
Product Description:
NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid. Additionally this probe offers excellent tip radius of curvature.Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 µm (220 - 230 µm)* | 33 µm (27.5 - 37.5 µm)* | 5 µm (4.5 - 5.5 µm)* | 15 N/m (9 - 25 N/m)* | 130 kHz (110 - 150 kHz)* | ||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 0 µm (10 - 15 µm)* | 10 - 15 µm* | 0 µm (0 - 0 µm)* | < 8 nm (< 12 nm guaranteed) |
* typical range
Coating:
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.Purchasing Information
Product Availability:
On stock
Price Description:
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank chargesTerms & Conditions:
your basket is EMPTY
Order:
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| SEIHR-W | 385 pcs | 5777.00 |
|
| SEIHR-10 | 10 pcs | 285.00 |
|
| SEIHR-20 | 20 pcs | 510.00 |
|
| SEIHR-50 | 50 pcs | 1125.00 |
|
| Request a free sample | |||