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SSE_FMR_13 Specification Sheet
AFM Probe Type: SSE_FMR_13
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Print spec sheetProduct Description:
SuperSharp Enhanced Soft Tapping
SuperSharp, long lifetime probe for very fine features. Soft tapping cantilever.
2 nm tip radius, high resolution probe with excellent lifetime and reliability. The nanotools® SSE_FMR_13 tip is designed for soft tapping/force modulation microscopy. The softer cantilever (2.8 N/m instead of 40 N/m) reduces the risk of tip damage during engaging. It delivers outstanding resolution and image stability in critical AFM applications even on hard, tip eating samples like ceramics, silicon oxide/nitride, polysilicon to name a few.
The tip end is made from HIGH-DENSITY, DIAMOND LIKE CARBON (HDC/DLC), thus offering the extreme durability of diamond together with high resolution imaging capability. The stiffness/Youngs modulus is 8 x of that of silicon. Applying our patented EBD (electron beam deposition) technique we ensure a stiff and rigid probe of nanometer precision.
- EBD tip on pointprobe FMR/FESPA AFM cantilever
- excellent tip radius: < 5 nm, typically 2 nm
- tip shape: conical, rotation-symmetric
- 100 % SEM check; good tip guarantee.
- high mechanical Q-factor for high sensitivity
- fits into automated AFM tools (in fab/in line)
This product features alignment grooves on the backside of the holder chip.
Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 µm (215 - 235 µm)* | 28 µm (20 - 35 µm)* | 3 µm (2 - 4 µm)* | 2.8 N/m (0.5 - 9.5 N/m)* | 75 kHz (45 - 115 kHz)* | ||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Supersharp, EBD |
0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* | < 2 nm (< 5 nm guaranteed) |
* typical range
Coating:
Aluminum reflective coating on the detector side of the cantilever. The Al reflective coating increases the laser signal by a factor of about 2.5. In particular it is recommended for highly reflective samples and machine vision applications.Probes Datasheets:
Included.Purchasing Information
Product Availability:
On stock
Price Description:
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank chargesTerms & Conditions:
Order:
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| SSE_FMR_13-5 | 5 pcs | 950.00 |
|
| SSE_FMR_13-25 | 25 pcs | 4275.00 |
|
DANGER!
One tiny amount of static electricity while you are handling these probes will destroy the tip!
We highly recommend that you utilize an ESD station and if you do not already have one, we have a mobile ESD station for only 70 EUR.
Considering the costs of these probes, this is a very wise investment.