NANOSENSORS™ SSS-FM AFM probes are designed for force modulation mode.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FM tip serves also as a basis for high resolution tips with magnetic coatings SSS-MFMR. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.
The probe offers unique features:
- excellent tip radius of curvature
- typical aspect ratio at 200 nm from tip apex in the order of 4:1
- monolithic material
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 225 µm (215 - 235 µm)* | 30 µm (20 - 35 µm)* | 3 µm (2 - 4 µm)* | 2.8 N/m (0.5 - 9.5 N/m)* | 75 kHz (45 - 115 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Supersharp | 0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* | < 2 nm (< 5 nm guaranteed) | < 10° at 200 nm from apex |
* guaranteed range
On stock
Does not include VAT or customs duties.
Payment within 30 days from date of invoice, no discount. Payment free of bank charges
| Order Code | Probes per Set | price, EUR | Quantity |
|---|---|---|---|
| SSS-FM-10 | 10 pcs | 653.00 |
|
| SSS-FM-20 | 20 pcs | 1169.00 |
|
| SSS-FM-50 | 50 pcs | 2576.00 |
|
One tiny amount of static electricity while you are handling these probes will destroy the tip!
We highly recommend that you utilize an ESD station and if you do not already have one, we have a mobile ESD station for only 70 EUR.
Considering the costs of these probes, this is a very wise investment.