SSS-FM datasheet
AFM Probe Type: SSS-FM
Product Description:
NANOSENSORS™ SSS-FM AFM probes are designed for force modulation mode.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FM tip serves also as a basis for high resolution tips with magnetic coatings (SSS-MFMR (link to SSS-MFMR datasheet). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.
The probe offers unique features:
- excellent tip radius of curvature
- typical aspect ratio at 200 nm from tip apex in the order of 4:1
- monolithic material
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| 1 | 225 µm(215 - 235 µm)* | 30 µm(20 - 35 µm)* | 3 µm(2 - 4 µm)* | 2.8 N/m(0.5 - 9.5 N/m)* | 75 kHz(45 - 115 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Radius | Half Cone Angles |
|---|---|---|---|
| 1 | Supersharp | <2 nm( < 5 nm guaranteed ) | < 10° at 200 nm from apex |
* guaranteed range
Coating:
None
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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