SSS-FM datasheet

manufacturer:
www.nanosensors.com
View this AFM Tip
on manufacturer's website

AFM Probe Type: SSS-FM

Product Description:

NANOSENSORS SSS-FM AFM probes are designed for force modulation mode.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon tip with unrivalled sharpness.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The SSS-FM tip serves also as a basis for high resolution tips with magnetic coatings (SSS-MFMR (link to SSS-MFMR datasheet). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

 
    The probe offers unique features:

        - excellent tip radius of curvature
        - typical aspect ratio at 200 nm from tip apex in the order of 4:1
        - monolithic material
        - highly doped to dissipate static charge
        - chemically inert
        - high mechanical Q-factor for high sensitivity

 

AFM Probe Specifications:
  AFM Cantilevers:
Cant. LengthWidthThicknessForce Const.Res. Freq.
1 225 µm(215 - 235 µm)* 30 µm(20 - 35 µm)* 3 µm(2 - 4 µm)* 2.8 N/m(0.5 - 9.5 N/m)* 75 kHz(45 - 115 kHz)*
  AFM Tips:
on Cant. ShapeTip RadiusHalf Cone Angles
1 Supersharp <2 nm( < 5 nm guaranteed ) < 10° at 200 nm from apex

* guaranteed range

Coating:

None

Purchasing Info:

Product Availability:
From stock
Price Description:

Does not include VAT or customs duties.

Order:
Order Code Sensors per Set price, EUR Quantity
SSS-FM-10
10 pcs 653.00 add to shopping cart
SSS-FM-20
20 pcs 1169.00 add to shopping cart
SSS-FM-50
50 pcs 2576.00 add to shopping cart
SSS-FM-W
385 pcs 12708.00 add to shopping cart

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