SSS-NCH datasheet
AFM Probe Type: SSS-NCH
Product Description:
NANOSENSORS™ SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The probe offers unique features:
- excellent tip radius of curvature
- typical aspect ratio at 200 nm from tip apex in the order of 4:1
- monolithic material
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| 1 | 125 µm(115 - 135 µm)* | 30 µm(30 - 45 µm)* | 4 µm(3 - 5 µm)* | 42 N/m(10 - 130 N/m)* | 330 kHz(204 - 497 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Radius | Half Cone Angles |
|---|---|---|---|
| 1 | Supersharp | <2 nm( < 5 nm guaranteed ) | < 10° at 200 nm from apex |
* guaranteed range
Sensors Datasheets:
Datasheet for all AFM probes with sets of 10 or 20 probes.
Datasheet for up to 32 probes with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
Terms and Conditions for NANOSENSORS