SiNi datasheet
AFM Probe Type: SiNi
Product Description:
This competitively priced silicon nitride AFM probe features:
- 4 silicon nitride cantilevers for soft contact mode with two different lengths and force constants, mounted on standard silicon support chip;
- silicon nitride wedge tip
- overall tip height is 12 μm (effective > 450 nm) with a double tip spacing of 450 μm.
- Macroscopic half cone angle is 35°.
Consistent high quality at a lower price!
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|---|
| 1 | triangle | 100 µm(90 - 110 µm)* | 16 µm(11 - 21 µm)* | 520 µm | 0.27 N/m | 30 kHz |
| 2 | triangle | 200 µm(190 - 210 µm)* | 30 µm(25 - 35 µm)* | 520 µm | 0.06 N/m | 10 kHz |
AFM Tips:
| on Cant. | Shape | Tip Height | Tip Radius | Half Cone Angles |
|---|---|---|---|---|
| 1 | Pyramid | 12 µm(10 - 14 µm)* | <15 nm | 35° (macroscopic) |
| 2 | Pyramid | 12 µm(10 - 14 µm)* | <15 nm | 35° (macroscopic) |
* typical range
Coating:
Gold/Chromium on detector side of the cantilever, 70 nm thick
Sensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
From stock. |
Price Description: |
Does not include VAT or customs duties. |
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