TESPA-HAR datasheet
AFM Probe Type:
TESPA-HAR
Original Manufacturer Type: NW-AR5-NCHR
Product Description:
NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.
These probes offer unique features:
- length of the high aspect ratio portion of the tip > 2 µm
- typical aspect ratio of this portion in the order of 7:1 (when viewed from side as well as along
cantilever axis)
- half cone angle of the high aspect ratio portion typically < 5°
- excellent tip radius of curvature
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Shape | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| beam | 125 µm(120 - 130 µm)* | 30 µm(25 - 35 µm)* | 4 µm(3.5 - 4.5 µm)* | 42 N/m(21 - 78 N/m)* | 320 kHz(250 - 390 kHz)* |
AFM Tips:
| Shape | Tip Height | Tip Radius |
|---|---|---|
| High-Aspect-Ratio | 10 - 15 µm* | <8 nm( < 12 nm guaranteed ) |
* typical range
Coating:
The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.
Sensors Datasheets:
Datasheet for all sensors with sets of 10 or 20 sensors.
Datasheet for up to 32 sensors with full wafer.
Purchasing Info:
Product Availability: |
From stock |
Price Description: |
Does not include VAT or customs duties. |
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