Tap300Al datasheet
AFM Probe Type: Tap300Al
Product Description:
Rotated, monolithic silicon AFM probe for non-contact high frequency applications (intermittent contact, tapping in air);
Symmetric tip shape;
The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). Chipsize: 3.4 x 1.6 x 0.3 mm
Consistent high quality at a lower price!
Application Modes:
AFM Probe Specifications:
AFM Cantilevers:
| Cant. | Length | Width | Thickness | Force Const. | Res. Freq. |
|---|---|---|---|---|---|
| 1 | 125 µm(115 - 135 µm)* | 30 µm(25 - 35 µm)* | 4 µm(3 - 5 µm)* | 40 N/m(20 - 75 N/m)* | 300 kHz(200 - 400 kHz)* |
AFM Tips:
| on Cant. | Shape | Tip Height | Tip Set Back | Tip Radius | Half Cone Angles |
|---|---|---|---|---|---|
| 1 | Rotated | 17 µm(15 - 19 µm)* | 15 nm(10 - 20 nm)* | <10 nm | 20°-25° along cantilever axis 25°-30° from side 10° at the apex |
* typical range
Coating:
Aluminium reflex coating on detector side of the cantilever, 30 nm thick
Sensors Datasheets:
No datasheet
Purchasing Info:
Product Availability: |
From stock. |
Price Description: |
Does not include VAT or customs duties. |
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