EBD2-100_NCH_13
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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EBD2-100_NCH_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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EBD2-100_NCHR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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M1_NCH_13
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
High-Aspect-Ratio, EBD
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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M1-ESD_NCH_13
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Aluminium
- Tip Shape:
Cone Shaped
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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MSS_NCHR_13
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Supersharp, High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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MSS_NCHR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Supersharp, EBD
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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MSS_FMR_13
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SuperSharp, Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Supersharp
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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MSS_FMR_3
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Standard Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Supersharp
- Cantilever:
Length: 225 µm
Force const.: 2.8 N/m
Res. freq.: 75 kHz
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MC90-70_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Cylindrical, Arrow , High-Aspect-Ratio
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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CNT100_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Arrow , High-Aspect-Ratio
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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CNT300_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Hard Diamond-Like-Carbon
- Tip Shape:
EBD, Arrow , High-Aspect-Ratio
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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CNT500_ArrowNCR_3
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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AR5-NCH
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High-Aspect-Ratio, Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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AR5-NCHR
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High-Aspect-Ratio, Tapping Mode AFM Probe
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- Coating:
Reflex Aluminium
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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NW-AR5-NCHR
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High-Aspect-Ratio, Tapping Mode AFM Probe
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- Coating:
Reflex Aluminium
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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TESPA-HAR
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High-Aspect-Ratio, Tapping Mode AFM Probe |
- Coating:
Reflex Aluminium
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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AR5-NCL
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High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever
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- Coating:
None
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
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AR5-NCLR
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High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Reflex Aluminium
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
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NW-AR5-NCLR
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High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever
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- Coating:
Reflex Aluminium
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 225 µm
Force const.: 48 N/m
Res. freq.: 190 kHz
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AR10-NCH
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High-Aspect-Ratio, Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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AR10-NCHR
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High-Aspect-Ratio, Tapping Mode AFM Probe
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- Coating:
Reflex Aluminium
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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NW-AR10-NCHR
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High-Aspect-Ratio, Tapping Mode AFM Probe
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- Coating:
Reflex Aluminium
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 320 kHz
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AR5T-NCH
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High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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AR5T-NCHR
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High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe
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- Coating:
Reflex Aluminium
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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NW-AR5T-NCHR
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High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe
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- Coating:
Reflex Aluminium
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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AR10T-NCH
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High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe
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- Coating:
None
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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AR10T-NCHR
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High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe
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- Coating:
Reflex Aluminium
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 42 N/m
Res. freq.: 330 kHz
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ISC-125C40-R
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High-Aspect-Ratio, Tapping Mode AFM Probe
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- Coating:
Reflex Aluminium
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 125 µm
Force const.: 40 N/m
Res. freq.: 300 kHz
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ISC-225C3_0-R
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High-Aspect-Ratio, Tapping Mode AFM Probe
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- Coating:
Reflex Aluminium
- Tip Shape:
High-Aspect-Ratio
- Cantilever:
Length: 225 µm
Force const.: 3 N/m
Res. freq.: 75 kHz
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CDR50-EBD
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , Cylindrical, EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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CDR70-EBD
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , Cylindrical, EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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CDR130-EBD
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High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe
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- Coating:
Diamond
- Tip Shape:
High-Aspect-Ratio, Arrow , Cylindrical, EBD
- Cantilever:
Length: 160 µm
Force const.: 42 N/m
Res. freq.: 285 kHz
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Call us: + 49 (0) 6441 870 6272 Wetzlar, Germany
AFM Probes
