| type |
manufacturer |
short description |
short specs: |
tip shape |
 AR5-NCH |
 |
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
High-Aspect-Ratio |
| AR5-NCHR |
|
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:Reflex Aluminum
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
High-Aspect-Ratio |
 NW-AR5-NCHR |
 |
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:Reflex Aluminum
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
High-Aspect-Ratio |
| TESPA-HAR |
|
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:Reflex Aluminum
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
High-Aspect-Ratio |
| AR5-NCL |
|
High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever |
coating:None
AFM cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
|
High-Aspect-Ratio |
| AR5-NCLR |
|
High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever |
coating:Reflex Aluminum
AFM cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
|
High-Aspect-Ratio |
| NW-AR5-NCLR |
|
High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever |
coating:Reflex Aluminum
AFM cantilever:
length: 225 µm
force const.: 48 N/m
res. freq.: 190 kHz
|
High-Aspect-Ratio |
 AR10-NCH |
|
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
High-Aspect-Ratio |
| AR10-NCHR |
|
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:Reflex Aluminum
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
High-Aspect-Ratio |
 NW-AR10-NCHR |
|
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:Reflex Aluminum
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 320 kHz
|
High-Aspect-Ratio |
 AR5T-NCH |
|
High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
High-Aspect-Ratio |
| AR5T-NCHR |
|
High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe |
coating:Reflex Aluminum
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
High-Aspect-Ratio |
 NW-AR5T-NCHR |
|
High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe |
coating:Reflex Aluminum
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
High-Aspect-Ratio |
| AR10T-NCH |
|
High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
High-Aspect-Ratio |
| AR10T-NCHR |
|
High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe |
coating:Reflex Aluminum
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 330 kHz
|
High-Aspect-Ratio |
 U1 |
 |
High-Aspect-Ratio, Special Tapping Mode AFM Probe |
coating:Available on Request
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 300 kHz
|
EBD |
 U1s |
|
High-Aspect-Ratio, Special Tapping Mode AFM Probe |
coating:Available on Request
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 300 kHz
|
EBD |
 U2 |
|
High-Aspect-Ratio, Special Tapping Mode AFM Probe |
coating:Available on Request
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 300 kHz
|
EBD |
 U2s |
|
High-Aspect-Ratio, Special Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 300 kHz
|
EBD |
 U3 |
|
High-Aspect-Ratio, Special Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 300 kHz
|
EBD |
 U3s |
|
High-Aspect-Ratio, Special Tapping Mode AFM Probe |
coating:Available on Request
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 300 kHz
|
EBD |
 SL2 |
|
High-Aspect-Ratio, Special Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 300 kHz
|
EBD |
 SL3 |
|
High-Aspect-Ratio, Special Tapping Mode AFM Probe |
coating:Available on Request
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 300 kHz
|
EBD |
 SL4 |
|
High-Aspect-Ratio, Special Tapping Mode AFM Probe |
coating:Available on Request
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 300 kHz
|
EBD |
 M1 |
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 42 N/m
res. freq.: 300 kHz
|
EBD |
 SC |
 |
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 40 N/m
res. freq.: 300 kHz
|
High-Aspect-Ratio |
| ISC |
|
High-Aspect-Ratio, Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 40 N/m
res. freq.: 300 kHz
|
High-Aspect-Ratio |
 DT |
|
High-Aspect-Ratio, Special Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 40 N/m
res. freq.: 300 kHz
|
High-Aspect-Ratio |
 TCDT |
|
High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe |
coating:None
AFM cantilever:
length: 125 µm
force const.: 40 N/m
res. freq.: 300 kHz
|
High-Aspect-Ratio |
