Product Description:

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping^™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.

 
    These probes offer unique features:

        - length of the high aspect ratio portion of the tip > 2 µm
        - typical aspect ratio of this portion in the order of 7:1 (when viewed from side as well as along
          cantilever axis)
        - half cone angle of the high aspect ratio portion typically < 5°
        - excellent tip radius of curvature

This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Veeco Instruments Inc. is no longer selling this probe which has always been manufactured by NanoWorld®.

Application Modes:

• Trench Measurement / High Aspect Ratio AFM Tips