NANOSENSORS™ AR10-NCHR AFM tips are designed for non-contact or tapping mode AFM. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 10:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 125 µm (115 - 135 µm)* | 30 µm (22.5 - 37.5 µm)* | 4 µm (3 - 5 µm)* | 42 N/m (10 - 130 N/m)* | 330 kHz (204 - 497 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| High-Aspect-Ratio | 0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* | < 15 nm guaranteed |
typically < 2.8° at 1.5 µm of the high aspect ratio portion |
* guaranteed range
On stock
No taxes applied except 6% in South Carolina.
Does not include shipment costs.
| Order Code | Probes per Set | price, USD | Quantity |
|---|---|---|---|
| AR10-NCHR-10 | 10 pcs | 1334.00 |
|
| AR10-NCHR-20 | 20 pcs | 2388.00 |
|
| AR10-NCHR-50 | 50 pcs | 5268.00 |
|
| AR10-NCHR-W | 385 pcs | 25636.00 |
|
One tiny amount of static electricity while you are handling these probes will destroy the tip!
We highly recommend that you utilize an ESD station and if you do not already have one, we have a mobile ESD station for only 69.95 USD.
Considering the costs of these probes, this is a very wise investment.