Product Description:

Optimized positioning through maximized tip visibility

NanoWorld Arrow™ CONTPt AFM probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.

All AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.

Additionally this probe offers an excellent tip radius of curvature.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

Application Modes:

• AFM Probes for Electrostatic Force Microscopy (EFM) / Electrical AFM Measurements (Tuna, SSR, SCM)

AFM Probe Specifications:

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle	half cone angle
	Arrow	0 µm (10 - 15 µm)*	10 - 15 µm*	0 µm (0 - 0 µm)*	< 10 nm

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.	probe base
	beam	450 µm (445 - 455 µm)*	45 µm (40 - 50 µm)*	2 µm (1.5 - 2.5 µm)*	0.2 N/m (0.06 - 0.38 N/m)*	14 kHz (10 - 19 kHz)*

* typical range

Coating:

The platinum iridium5 (PtIr5) coating on both sides of the probe allows electrical contacts between tip and sample (high conductivity) while enhancing the reflectivity of the cantilever. The typical tip radius of curvature is less than 25 nm.