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ARROW-EFM Specification Sheet
AFM Probe Type: ARROW-EFM
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Product Description:
Silicon based beam deflection cantilever for electrostatic force mode. Rectangular cantilever that is shaped like an arrow. PtIr5 coating on both sides. PtIr-coating on both sides.Wide detector side for easy adjustment of the detection system, small width at the tip side reduces damping . The unique Arrow™ shape of the cantilever allows easy positioning of the tip on the area of interest. Tip radius with coating less than 25 nm.Application Modes:
AFM Probe Specifications:
AFM Cantilever(s):
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| 240 µm (235 - 245 µm)* | 35 µm (30 - 40 µm)* | 3 µm (2.5 - 3.5 µm)* | 2.8 N/m (1.4 - 5.8 N/m)* | 75 kHz (58 - 97 kHz)* | |||
AFM Tips:
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Arrow | 0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* |
* typical range
Coating:
Platinum/Iridium coating on both sides of the sensor allows electrical contacts between tip and sample (high conductivity)Purchasing Information
Product Availability:
On stock
Price Description:
No taxes applied except 6% in South Carolina.
Does not include shipment costs.Terms & Conditions:
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Order:
| Order Code | Probes per Set | price, USD | Quantity |
|---|---|---|---|
| ARROW-EFM-10 | 10 pcs | 370.00 |
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| ARROW-EFM-20 | 20 pcs | 660.00 |
|
| ARROW-EFM-50 | 50 pcs | 1460.00 |
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| ARROW-EFM-W | 380 pcs | 7500.00 |
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