AFM Probes » Akiyama-Probe

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Quantity
A-PROBE-10 Probes per set 10 pcs
$600.00

Akiyama-Probe Novel self-sensing, self-actuating AFM probe for intermittent contact

Coating: None
Tip shape: Visible
Cantilever:*
F 50 kHz
C 5 N/m
L 310 µm
*nominal values

Novel self-sensing and self-actuating (-exciting) probe for dynamic mode Atomic Force Microscopy (AFM)


Akiyama-Probe is based on a quartz tuning fork combined with a micromachined cantilever. The great advantage of this novel probe is that one can benefit from both the tuning fork's extremely stable oscillation and the silicon cantilever's reasonable spring constant with one probe.

Akiyama-Probe is equipped with a special version of the NANOSENSORS™ AdvancedTEC, a high-end sharp silicon tip and has an excellent imaging capability on various samples with different properties, which is as high as that of a conventional optical lever system.

Akiyama-Probe requires neither optical detection, nor an external shaker. Akiyama-Probe occupies only a small volume above the sample. These features make it very attractive for creating a new generation of scanning probe microscopy (SPM) instruments.

Uncoated

AFM Tip:

  • Visible
  • 28 µm
  • < 15 nm
  • AFM Cantilever:

  • Double beam
  • 310 µm
  • 30 µm
  • 3.7 µm
  • 5 N/m
  • 50 kHz
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