AFM Probe Type: All-In-One

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manufacturer:

www.budgetsensors.com

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Product Description:

Versatile silicon AFM probe with 4 different cantilevers on a single AFM holder chip. Rotated, monolithic silicon AFM probe for various applications (Contact Mode, Force Modulation Mode, Tapping Mode and Soft Tapping Mode);

Symmetric tip shape;

The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right cantilever for each application. You dont need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes.

BudgetSensors offers consistent high quality at a lower price!

Application Modes:

AFM Probe Specifications:

AFM Cantilever(s):

cant.	shape	length	width	thickness	force const.	res. freq.
1Tapping Mode	beam	100 µm (90 - 110 µm)*	50 µm (45 - 55 µm)*	2.7 µm (1.7 - 3.7 µm)*	40 N/m (7 - 160 N/m)*	350 kHz (200 - 500 kHz)*
2Soft Tapping	beam	150 µm (140 - 160 µm)*	30 µm (25 - 35 µm)*	2.7 µm (1.7 - 3.7 µm)*	7.4 N/m (1 - 29 N/m)*	150 kHz (70 - 230 kHz)*
3Force Modulation	beam	210 µm (200 - 220 µm)*	30 µm (25 - 35 µm)*	2.7 µm (1.7 - 3.7 µm)*	2.7 N/m (0.4 - 10 N/m)*	80 kHz (50 - 110 kHz)*
4Contact Mode	beam	500 µm (490 - 510 µm)*	30 µm (25 - 35 µm)*	2.7 µm (1.7 - 3.7 µm)*	0.2 N/m (0.04 - 0.7 N/m)*	15 kHz (10 - 20 kHz)*

AFM Tips:

cant.	shape	tip height	tip set back	tip radius	full cone angle
1Tapping Mode	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 10 nm	20°-25° along cantilever axis; 25°-30° from side; 10° at the apex
2Soft Tapping	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 10 µm	20°-25° along cantilever axis; 25°-30° from side; 10° at the apex
3Force Modulation	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 10 nm	20°-25° along cantilever axis; 25°-30° from side; 10° at the apex
4Contact Mode	Rotated	17 µm (15 - 19 µm)*	15 - 19 µm*	15 µm (10 - 20 µm)*	< 10 nm	20°-25° along cantilever axis; 25°-30° from side; 10° at the apex

* typical range

Coating:

None

Purchasing Information

Product Availability:
On stock
Price Description:
No taxes applied except 6% in South Carolina.
Does not include shipment costs.
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Order Code	Probes per Set	price, USD	Quantity
AIO-10	10 pcs	240.00
AIO-50	50 pcs	1000.00

All-In-One Specification Sheet

AFM Probe Type: All-In-One

manufacturer:

Product Description:

Application Modes:

AFM Probe Specifications:

AFM Cantilever(s):

AFM Tips:

Coating:

Purchasing Information

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Price Description:

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