NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging.
For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.
| cant. | shape | length | width | thickness | force const. | res. freq. | probe base |
|---|---|---|---|---|---|---|---|
| beam | 450 µm (440 - 460 µm)* | 50 µm (42.5 - 57.5 µm)* | 2 µm (1 - 3 µm)* | 0.5 N/m (0.1 - 1.7 N/m)* | 20 kHz (11 - 29 kHz)* | ||
| cant. | shape | tip height | tip set back | tip radius | full cone angle | half cone angle | |
|---|---|---|---|---|---|---|---|
| Standard | 0 µm | 0 - 0 µm* | 0 µm (0 - 0 µm)* | < 200 nm guaranteed |
* guaranteed range
On stock
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Does not include shipment costs.
| Order Code | Probes per Set | price, USD | Quantity |
|---|---|---|---|
| CDT-CONTR-10 | 10 pcs | 1481.00 |
|
| CDT-CONTR-20 | 20 pcs | 2650.00 |
|
| CDT-CONTR-50 | 50 pcs | 5846.00 |
|
| Request a free sample | |||