AFM Probes » CONTSC

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Order Code Price
Quantity
CONTSC-10 Probes per set 10 pcs
$279.00
Volume Discount Available
CONTSC-20 Probes per set 20 pcs
$500.00
CONTSC-50 Probes per set 50 pcs
$1 104.00
CONTSC-W Probes per set 385 pcs
$5 672.00

CONTSC

Contact Mode AFM Probe with Short Cantilever

Coating: None
Tip shape: Standard
Cantilever:*
F 25 kHz
C 0.2 N/m
L 225 µm
*nominal values
NanoWorld Pointprobe® CONTSC AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probes offers an excellent tip radius of curvature.

Uncoated

AFM Tip:

  • AFM Cantilever:

  • Beam
  • 225 µm (220 - 230 µm)*
  • 48 µm (42.5 - 52.5 µm)*
  • 1 µm (0.5 - 1.5 µm)*
  • 0.2 N/m (0.02 - 0.7 N/m)*
  • 25 kHz (10 - 39 kHz)*
  • * typical range This product features alignment grooves on the back side of the holder chip.

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