AFM Probe Type: CP-NCH-SiO

Product Description:

NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). 

The so called "Colloidal Probe Technique", where single colloids are attached to AFM cantilevers for force measurements, opens the chance for a better understanding of fundamental interactions in a variety of fields.

Examples are adhesion phenomena, particle-surface-interactions, mechanical properties, suspensions, hydrodynamics and boundary slip - to name just some out of an increasing number of applications.

 
    The probe offers unique features:

        - sphere material: silicon dioxide (SiO₂)
        - excellent sphere, diameter A = 2 µm, B = 3,5µm, or C = 6,62 µm (all +/- 5%)
          (Due to different masses the resonance frequency can differ.)
          Please choose A, B, or C by ordering
        - highly doped cantilever to dissipate static charge
        - chemically inert
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
        of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the backside of the holder chip.

Application Modes:

• Colloidal Probes
• Sphere AFM Tips
• AFM Probes for Biological Applications / Soft Contact Measurements
• Diamond coated,Hardened, Nanoindentation AFM Tips
• Non-Contact / Tapping Mode AFM Probes